End-to-end Quality Information Framework (QIF) Technology Survey

End-to-end Quality Information Framework (QIF) Technology Survey

Auteur : John Michaloski

Date de publication : 2016

Éditeur : U.S. Department of Commerce, National Institute of Standards and Technology

Nombre de pages : 32

Résumé du livre

The goal of this paper is to understand how quality information characterizing the manufactured parts can be reported in a XML standardized format. The Quality Information Framework (QIF) is an ANSI standard sponsored by the Dimensional Metrology Standards Consortium (DMSC) that defines an integrated set of XML information models to enable the effective exchange of metrology data throughout the entire manufacturing quality measurement process - from product design to inspection planning to execution to analysis and reporting. The desire is that QIF will help foster a pervasive digital thread throughout the product lifecycle contributing to feedforward and feedback flow of quality information. The hope is that widespread adoption of QIF will lead to better and more optimized part design and manufacturing processes performance.

Connexion / Inscription

Saisissez votre e-mail pour vous connecter ou créer un compte

Connexion

Inscription

Mot de passe oublié ?

Nous allons vous envoyer un message pour vous permettre de vous connecter.