Book Reviews
Auteur : Denis Fred Simon, Wei Xie, Liqin Ren, H. J. H. Brouwers
Date de publication : 2004
Éditeur : SSRN
Nombre de pages : 7
Résumé du livre
Books reviewed: Kathleen Walsh, Foreign High-Tech R&D in China: Risks, Rewards and Implications for US-China Relations Review of Leading Chinese Journals Reporting on R&D Management and Innovation G. C. Chow, Knowing China.