Incidental Trends and the Power of Panel Unit Root Tests

Incidental Trends and the Power of Panel Unit Root Tests

Auteur : Hyungsik Roger Moon, Benoit Perron, Peter C. B. Phillips

Date de publication : 2013

Éditeur : SSRN

Nombre de pages : 64

Résumé du livre

The asymptotic local powers of various panel unit root tests are investigated. The power envelope is obtained under homogeneous and heterogeneous alternatives. It is compared with asymptotic power functions of the pooled t-test, the Ploberger-Phillips (2002) test, and a point optimal test in neighborhoods of unity that are of order n^{-1/4}T^{-1} and n^{-1/2}T^{-1}, depending on whether or not incidental trends are extracted from the panel data. In the latter case, when the alternative hypothesis is homogeneous across individuals, it is shown that the point optimal test and Ploberger-Phillips test both achieve the power envelope and are uniformly most powerful, in contrast to point optimal unit root tests for time series. Some simulations examining the finite sample performance of the tests are reported.

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