Electronic Materials Innovations and Reliability in Advanced Memory Packaging
Auteur : Chong Leong Gan, Chen Yu Huang
Date de publication : 2025-07-21
Éditeur : Springer Nature
Nombre de pages : 178
Résumé du livre
This book provides a comprehensive introduction the reliability, and electronic materials innovations in advanced memory device packaging from component to system level. Special features of this book are sections covering not only the advanced packaging materials, but also system level packaging and integration in memory modules and solid state drives (SSD).
The book is an extremely useful and applicable guide to professionals and students on materials reliability in memory device packaging - from component to system level.