Abstracts of Unclassified Technical Reports Issued by Stanford Electronics Laboratories 1949 Through 1958
The Stanford Emulation Laboratory
Abstracts of Unclassified Technical Reports Issued by Stanford Electronics Laboratories During 1959
Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality
External Circuit Traveling-wave Tubes
Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection
Abstracts of Unclassified Technical Reports Issued by Stanford Electronics Laboratories During 1960
Experimental Study of Tapped Delay-line Filters
The error latency of a combinational digital circuit
Mathematical Models for the Circuit Layout Problem